Press-release on the visit of the Japan Patent Office examiners

On January 20 – February 2, 2013 in the framework of the examiner exchange program a delegation consisting of two Japan Patent Office examiners paid a working visit to Rospatent. The visit was aimed at familiarization with the structure and functions of Rospatent and FIPS, in particular – exploration of the examination procedure, the search system PatSearch and automated workflow systems.

Representatives of the Japan Patent Office highly appreciated the work of Russian examiners and expressed great interest in further cooperation.

In the course of the working program the delegation also visited the Russian State Academy of Intellectual Property (RGAIS) and had a two-day training at the Eurasian Patent Office.